Ethernet White Papers

Gigabit Ethernet Functional Module Test Platform - Dramatically Increases Throughput Using Parallel Test

Overview Existing sequential test systems for the Device Under Test (DUT) required 12 minutes per module. Market demand for the product was such that customer needs could not be met unless test throughput was increased. The challenge facing IE's engineers was to develop a test solution that dramatically decreased test times without dramatically increasing costs. Parallel test architecture was the answer. IE was able to develop application software modules that execute each test in parallel on multiple channels of the DUT. These test suites were sequenced through the test executive and the data was analyzed and presented in a detailed test report, locally resident with a Central Database link.

Further White Paper Details
PublisherInstrumentation Engineering File FormatPDF
Date PublishedMarch 2005
FormatCase Studies   
Topics

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