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The Recursive NanoBox Processor Grid: A Reliable System Architecture for Unreliable Nanotechnology Devices
Overview Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS devices. The authors introduce the Recursive NanoBox Processor Grid as an application specific, fault tolerant, parallel computing system designed for fabrication with unreliable nanotechnology devices. In this paper, the authors construct VHDL models of the NanoBox Processor cell ALU and evaluate the effectiveness of the recursive fault masking approach in the presence of random transient errors. The analysis shows that the ALU can calculate correctly 100 percent of the time with raw FIT (failures in time) rates as high as 1023.
| Publisher | University of Minnesota | File Format | |
|---|---|---|---|
| Date Published | March 2004 | Downloads | 1 |
| Format | White Papers | ||
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