Monitoring Systems White Papers

Semiconductor Yield Enhancement Solutions for Next Generation

Overview Among LSI (large-scale integration) manufacturers, yield enhancement is one of the essential means of securing a profit. For this purpose, semiconductor inspection systems are required to handle a larger number of defects to be detected and localize the faulty points. Hitachi has been offering high-performance semiconductor and evaluation tools applicable to 130- to 90-nm nodes as systems to support yield enhancement in semiconductor manufacturing. This paper introduces performance-upgraded semiconductor inspection and evaluation tools, applicable to 90-nm nodes and beyond, and describes solutions for semiconductor yield enhancement.

Further White Paper Details
PublisherHitachi File FormatPDF, requires Acrobat Rdr 5
Date PublishedOctober 2002 Downloads72
FormatWhite Papers   
Topics
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