Overview
With the advances on analog-digital integrated circuits, faster and more complex test equipment are required to meet ever more severe test specifications. An attractive alternative to simplify the test equipment is to move some or all the tester functions onto the chip itself. The use of Built-In-Self-Test for high volume production of mixed signal ICs is desirable to reduce the cost per chip during production-time testing by the manufacturers. In addition, it helps to perform diagnosis in the field. The objective of this paper is to discuss the possibility of reusing the existing hardware originally present in an analog application to implement test functions for a completely autonomous self-testable solution.
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This IDC White Paper analyzes the latest technology and market developments in the x86 server space, which has been significantly impacted by the spread of virtualization solutions and the rise of energy issues. The paper puts AMD's latest 45nm quad-core AMD Opteron Processor, codenamed "Shanghai," in context in this environment and analyzes its opportunities in the European market.
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When deploying new software configuration management (SCM) tools, implementers sometimes focus on perfecting fine-grained activities, while unwittingly carrying forward poor, large-scale practices from their previous jobs or tools. The result is a well-executed blunder. This paper promotes some high-level best practices that reflect the authors' experiences in deploying SCM.
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