Embedded Microprocessors White Papers
Solving the Challenges of Testing Small Embedded Cores and Memories Using FastScan MacroTest
Overview FastScan MacroTest™ is a breakthrough technology that automates the generation of manufacturing test vectors for small, embedded cores and memories while minimizing the impact on performance, reducing the area of the design, and increasing overall product quality. One of the biggest challenges in designing system-on-chip (SoC) and very large ICs is the testing of a large number of small, embedded cores and memories. These SoC designs may contain hundreds of small macros embedded in combinational logic accessible through scan. Typically the tests for these macros are defined for the input and output ports. Even though the macros themselves are small, very often the interfaces are very wide. In case of multiple port memories, they may exceed several hundreds, or even one thousand, ports.
| Publisher | Mentor Graphics Corporation | File Format | PDF, requires Acrobat Rdr 5 |
|---|---|---|---|
| Date Published | September 2003 | Downloads | 143 |
| Format | White Papers | ||
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